Waveguide Spectroscopy of Thin Films, Volume 33 (Thin Films and Nanostructures)

Engineering & Transportation | Engineering
Waveguide Spectroscopy of Thin Films, Volume 33 (Thin Films and Nanostructures)
Title:
Waveguide Spectroscopy of Thin Films, Volume 33 (Thin Films and Nanostructures)
Author:
-
ISBN:
0120885158
ISBN13:
978-0120885152
Size PDF:
1390 kb
Size epub:
1688 kb
Publisher:
Academic Press; 1 edition (January 6, 2006)
Language:
English
Other formats:
pdf, odf, mobi, cb7, azw, lit, ibooks
Rating:
3.7
Votes:
262

In Waveguide Spectroscopy of Thin Films new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures.

Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered.

This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties.

  • There are new techniques of measurement of thin-film parameters stated

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